样品名称 | 进口碲化锆锗晶体 ZrGeTe4 | 性质 | 半导体 | 带隙 |
| 参数 | 尺寸:~3-5mm, 纯度≧99.9995% | 应用 | 半导体电子器件,传感器-探测器,光学器件等研究 | 其他性质 | 详情请发邮件至:mknano@126.com. |
碲化锆锗晶体ZrGeTe4

Product Description: ZrGeTe4 crystal is a layered anisotropic semiconductor with the predicted bandgap of 0.4 eV. While it is layered and can be exfoliated down to few- and monolayers, their properties remain largely unknown. Our ZrGeTe4 vdW crystals are synthesized using flux zone growth technique at unparalleled 99.9999% confirmed purity rates. Crystals are cut in c-axis and thus are ready to exfoliate onto desired substrates.
Summary of ZrGeTe4 vdW crystals

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